Santa Clara, Calif.-- Oct. 21, 1997-- Electroglas, Inc., a market-leading supplier of expert wafer probing, information management, and software-based manufacturing and yield enhancement products to the global semiconductor industry, announced that Semiconductor International magazine has selected Knights Technology's YieldManager for a 1997 Editors' Choice Best Product Award.
YieldManager was recognized as one of 20 products significantly enhancing semiconductor manufacturing.
Candidates for the award must be nominated by customers who are successfully using the product in their facilities. It was also required that the product be proven to enhance the results of semiconductor or related manufacturing. The editors of SemiconductorInternational then voted on the nominees. Twenty winners were presented with the award at a ceremony in Austin, Texas the Monday during the week of SEMICON Southwest.
YieldManager is a customized, instrument-independent software solution that allows fab engineers to collect, analyze, and graphically display essential process, inspection, and test data to help identify the sources of semiconductor yield loss. The YieldManager system is the only independent software tool designed tointerface with equipment to collect data from the entire process flow-design, wafer process, inspection, metrology, parametric, and electrical test.
The YieldManager tool is an open-architecture, client/server system using the TCP/IP protocol and EtherNet connections to enable interconnectivity and enterprise-wide commuting. The software solution's open architecture provides simple connectivity between various fab equipment and worldwide sharing of yield data among a manufacturer's various wafer fabs.
Knights' YieldManager system brings together critical data to help determine which process zones or tools are most significantly contributing to yield loss. It provides a common location and formatfor presenting this data and doing cross-correlations between data types. YieldManager links to Knights' Megalab and Merlin's Framework software for defect review. SPaR (Spatial Pattern Recognition), a recent addition to the Knights product line, can alsobe used with YieldManager to effectively group defects into signatures that can be classified into process events. Additionally,the recently announced Q-YIELD product adds unparalleled data mining capabilities to Knights' yield enhancement software.
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