San Jose, Calif.--May 25, 1998--Logicvision, Inc. (San Jose) announced that Toshiba America Electronic Components, Inc. (TAEC; San Jose) is now supporting Logicvision's memBIST-IC for its system-level integration ASIC customers. TAEC will support the built-in self-test (BIST) solution for its full line of embedded SRAMs and ROMs, including its 0.25-m TC240 SRAM and ROM family.
Under the multiyear agreement between TAEC and Logicvision, TAEC will support Logicvision's memory BIST solution at all TAEC design centers. TAEC customers can choose between using memBIST-IC themselves to generate the BIST objects at their site or receiving the memory BIST design objects generated by TAEC's design center engineers. TAEC's memory compilers will automatically generate the memory library files needed as input for the memBIST-IC software.
Logicvision offers memBIST-IC as a stand-alone product, as well as an option to icBIST. ICBIST provides at-speed test and diagnostics for high-speed logic, embedded memory, mixed- signal and legacy cores, as well as for I/Os, interconnects, and memory modules at the system level.
System IC Division
1060 Rincon Circle
San Jose, CA 95131
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