Camarillo, Calif.--May 18, 1998--Vitesse SemiconductorCorp. (Camarillo) introduced the VSC8109, the first IC tointegrate a complete set of Bit Error Rate Tester (BERT) functions into asingle device for implementing 2.5Gbit/s and 10Gbit/s SONET/SDHcommunications equipment test systems. The device generates and comparesa 16-bit 155/622 Mbit /s pseudo-random binary sequence (PRBS) pattern and canbe connected to Vitesse multiplexers and demultiplexers to provide systemdesigners with a serial tester.
The VSC8109 addresses several test issues facing the telecom industry. The proliferation of equipment operating at 2.5Gbit/s and 10Gbit/s requiresmore affordable stand-alone and built-in test instrumentation capable ofthese high speeds. Telecom equipment vendors use this product toimplement serial test capability within their systems - eliminating theneed for stand-alone equipment. There is an additional need forinexpensive serial test capability in WDM systems that incorporate up toseveral communication channels, and the VSC8109 allows the design ofmulti-channel testers specifically for these systems.
This integrated circuit is a variable length PRBS sequence generator andcomparator that provides comprehensive serial test capability. Sequencelengths of up to 2^31-1 permutations with an adjustable mark ratio aresupported, and an STS-192/STM-64 A1/A2 frame boundary can be optionallyinserted. The PRBS comparator has a 16 bit error accumulator withoverflow, allowing the characterization of channels with high bit errorrates and providing the necessary error resolution for testing over longtime periods. The 16 bit ECL I/O interface is designed to work withVitesse standard 2.5Gbit/s or 10Gbit/s Mux and Demux products, simplifyingthe design of the high-speed serial interface.
This device is packaged in a low cost 208-pin PQFP. Samples areavailable now with production scheduled for August. Pricing is $195 eachin quantities of 1000 or more.
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