San Jose--June 15, 1998--Logicvision, Inc. (San Jose) disclosed that Sun Microsystems, Inc. (Palo Alto, Calif.) has become a customer of its ICBIST product.
Sun is incorporating embedded ATE in their ASIC design cycle. Once designed into the ASIC, embedded ATE delivers high fault coverage test at application speeds for the entire life of the ASIC. Sun can use the same embedded ATE to test the ASIC on the chip tester, board tester, during system test in the factory, and at customers' sites.
101 Metro Drive, Third Floor
San Jose, CA 95110
Return to Headlines