Beaverton, Ore--June 29, 1998--Integrated Measurement Systems' (IMS; Beaverton) Virtual Test Division announced the availability of Virtual Test Emulator (VTE), a test emulation software product to provide complete test-program execution and debug without the use of automated test equipment (ATE). Using Virtual Test Emulator, test engineers can now debug test programs off-line prior to having silicon available.
Initially developed for a large Japanese flash memory manufacturer by IMS, in conjunction with Hewlett Packard and Synopsys, VTE extends IMS' Digital VirtualTester technology for test pattern debug to provide full ATE program debug capability, without the tester. VTE uses an IMS-developed VHDL simulation model of the tester and the device under test.
VTE compiles and runs complete V1000/1200 test programs including digital, memory, and DC parametric tests using an IMS-developed VHDL model of the tester, along with the designer's device model. VTE also provides debug capabilities that enable test engineers to probe device pins and internal device and tester nodes.
VTE provides both ATE and simulation waveform views. The waveform display provides a view of the test, speeding the resolution of design and test issues.The Virtual Test Emulator software for the V1000, which starts at $75,000, is available immediately.
IMS' Virtual Test Division
9525 S.W. Gemini Drive
Beaverton, OR 97008
(800) 879-7117 or (503) 626-7117
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