Sunnyvale, Calif.--June 24, 1998--Simplex Solutions, Inc. (Sunnyvale) announced a newmethodology for validating the accuracy of interconnect extraction tools forelectronic circuit design.
In addition, the company announced that the methodology and associatedtest structures would be licensed free of charge to the entire worldwidechip design industry. The new methodology, called COSMIC (comprehensivesemiconductor measurement of interconnect capacitance), is now available onthe Simplex web site.
Simplex has used the COSMIC methodology on test chips manufactured byChartered Semiconductor Manufacturing, Inc. and United Microelectronics,Inc. to validate that Simplex' Fire & Ice full-chip 3D extraction toolis within +/-10 percent of Chartered and UMC's silicon. Simplex is in theprocess of completing test chips with three additional foundry partnerswithin the next three months -- NEC, TSMC, and Toshiba.
COSMIC is an "active" approach to measuring capacitance at thefemtofarad level (one femtofarad is equal to 0.001 picofarad), as it uses anon-chip sensor circuit for the measurements. It is based on researchoriginally performed at UC Berkeley that Simplex enhanced to produce COSMIC.
Simplex Solutions, Inc.
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