Fremont, Calif.--July 9, 1998--Credence Systems Corp.(Fremont) introduced a new, optional configuration of Credence's high-pin-count ValstarSeries' VS 2000 test system, the VS 2000e, which will be unveiled at Semicon West98 in the San Jose Convention Center July 15 through 17 (Booth No. 11927).
The new configuration is designed to increase productivity and reduce operatingcosts. With its small size and flexible production interface, itallows manufacturers and assemblers to customize the configuration to suittheir production requirements. It's easily configured as an integrated solutionfor high-volume production facilities.
The integration of the VS 2000e to the prober or handlerreduces the test system floor space to less than three squaremeters. The new configuration also delivers greater flexibility for testcell layout and optimization of available space.
The VS 2000e matches all of the capabilities of the VS 2000 for testingof complex logic, embedded memory, and embedded analog prevalent in high-pin-count VLSI chips. Specific applications includemicroprocessors, controllers, advanced chip sets, ASICs, and FPGAs.
Combining 3.0 Gbit Scan memory and ahigh-speed Iddq measurement feature, the VS 2000e enables multisite testingof up to 16 devices in parallel to maximize production throughput of themost complex devices.
Credence Systems Corp.
Return to Headlines