San Antonio--Aug. 30, 1999--Teradyne, Inc. (Boston) announcedat Autotestcon '99 that its functional board test products fully support therecently approved IEEE digital functional test data standard: Digital TestInterchange Format (DTIF), IEEE standard (Std) 1445.
The approval of DTIF as a full IEEE standard culminates a four-year effortthat involved dozens of companies representing digital test equipmentsuppliers, test program set (TPS) developers, and TPS users. The team workedto develop a data-exchange format that would address the problems of testprogram data content and format inconsistencies that have made datapostprocessing difficult and test data reuse nearly impossible.
The DTIF standard establishes a universal data format for digital Go/NoGoand diagnostic test data. Postprocessors can now be easily written totranslate test data from any digital test program generation (DTPG) tool intoDTIF, as well as from DTIF to any ATE-specific test program format. From asingle standard database of simulation data, test programs can be generatedfor a variety of functional test platforms. By creating translators that usethe DTIF standard, legacy test programs can be rehosted to modern ATEplatforms.
Teradyne's LASAR, VICTORY, M9-Series, and Spectrum functional testproducts fully support the DTIF standard. LASAR test generation softwarewrites DTIF files through its LSRTAP postprocessor. In the VICTORY family ofboundary-scan test generation and diagnostic software, the Boundary-ScanIntelligent Diagnostics (BSID) product uses DTIF fault dictionary files fordiagnosing Virtual Component and Cluster Test (VCCT) faults in non-scanclusters. The Spectrum family of functional testers with M9-Series digitaltest instruments import DTIF files directly for use in Go/NoGo and diagnostictest programs, eliminating the need for additional data translation.
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