Santa Clara, CA — Agilent Technologies has introduced a new 3GPP LTE measurement application for its X-Series signal analyzers. Claiming the industry's most comprehensive embedded solution with hardkey/softkey and SCPI programming user interface, the measurement application brings physical layer testing of uplink (UL) and downlink (DL) LTE signals to the test rack. When coupled with the X-Series analyzers, it offers some of the fastest LTE measurements in the market, making it especially well-suited for use in automated testing during design validation and prototype production.
The Agilent N9080A LTE measurement application, along with the X-Series analyzers, provides a more complete picture of LTE signal problems and their causes for better, faster design troubleshooting. It offers the same rich feature set as the LTE option found in the company's industry-leading 89600 Vector Signal Analysis (VSA) software, but also puts comprehensive LTE signal analysis in the test rack with familiar automation tools like SCPI programming and LAN/LXI compatible interfaces. As a result, the engineer spends more time validating designs and implementing tests, and less time learning programming tools and instrument interfaces.
With its coverage of the latest 3GPP LTE standard, the N9080A enables effective analysis of UL and DL LTE signals, including single-channel MIMO analysis, in a single option. As a result, engineers can make transmitter measurements on eNB (base station) and user equipment (mobile station) with considerable savings compared to other commercially available LTE software.
The N9080A supports all LTE bandwidths and modulation formats per the latest 3GPP TS 36 standards. Specific modulation quality measurements include EVM per OFDM carrier, EVM per OFDM symbol, EVM per slot and EVM per Resource Block — a measurement unique to Agilent. These measurements help identify EVM performance per user, per radio frame, per sub-frame, per slot, per resource block, and per symbol. Selective analysis by channel, subcarrier or symbol help the engineer troubleshoot and uncover previously unseen errors.
The new LTE measurement application features a well-designed user interface, including four simultaneous, user-selected displays. This saves the engineer time by displaying desired measurements without switching. Marker coupling among multiple traces, plus color coding by channel type, speeds the process of tracking an error from the constellation through the multiple EVM traces.
X-Series signal analyzers feature the MXA and EXA solutions. MXA claims to be the industry's fastest, most accurate mid-range signal analyzer. The EXA offers speed at a lower price point.
An additional product aimed at LTE is the 89600 VSA software with LTE option. It can be used with more than 30 Agilent products to make LTE measurements anywhere in the block diagram — from baseband to antenna, on digitized or analog signals — using spectrum and signal analyzers, oscilloscopes and logic analyzers. Measurements can also be made on simulated designs created with the the company's EEsof Advanced Design System.
For further information visit www.agilent.com/find/LTE.