With high speed digital designs frequently encountering analog effects, test and measurement experts Dr. Geoff Lawday, David Ireland and Greg Edlund have written a practical guide to help digital designers identify, analyse and ultimately solve their signal integrity issues. Entitled 'A signal integrity engineer's companion: real-time test and measurement and design simulation', the book provides a detailed insight into signal integrity engineering, taking the reader through the design cycle from feasibility to verification, and from simulation to test.
Written for practising signal integrity engineers, chip designers and students, the authors detail how an engineer can use real-time test and measurement to address increasingly difficult interoperability and compliance requirements. In addition, start-to-finish case studies cover common design challenges, such as calculating total jitter budgets and managing complex tradeoffs in high-speed serial interface design. Notably, there are case studies on DDR2 memory systems and the PCI Express serial bus; two important areas of high-speed digital design.
Whilst there are several well-respected tombes covering the theoretical aspects of signal integrity engineering, the authors believe that this is the first to cover the practical aspects of simulation, test and measurement. Comments Lawday, Tektronix Professor in Measurement at Buckinghamshire New University: "Most SI books centre on the work of the digital design engineer, but generally have advanced theoretical content. In addition, they assume that the engineer understands the analogue world, and hardly any of the SI books features measurement techniques."
Jointly written by David Ireland, European Design & Manufacturing Marketing Manager for Tektronix, and Greg Edlund, Senior Engineer with IBM Global Engineering Solutions Division, the book covers a variety of test and measurement tools and includes ways in which different instruments can be integrated to provide simultaneous analysis of analogue and digital effects.
For an extract of the book click here