PARIS – Ricoh Company Ltd. said it has licensed the HiDFT-SIGNOFF Design-for-Test (DFT) solution from France-based EDA startup DeFacTo Technologies SA and reduced turnaround time during DFT process.
DeFacto's HiDFT-SIGNOFF enables scan logic insertion at RTL. HiDFT-SIGNOFF permits designers to create a high-level design for test signoff methodology, closing the gap between RTL and DFT. HiDFT-SIGNOFF allows early identification of test issues and enables new pre-synthesis design and DFT verifications.
Figure: HiDFT-SIGNOFF methodology
Ricoh indeed explained that DeFacTo’s HiDFT-SIGNOFF has enabled to detect key testability issues and to improve test coverage early at RTL level. Evaluation has demonstrated that the HiDFT-SIGNOFF flow helps moving the DFT flow from gate-level to RTL level. It allows accurate test coverage evaluation at RTL.
Ricoh added that HiDFT-SIGNOFF allows a full RTL interoperability with mainstream ATPG, test compression tools and synthesis tools. Then, the simulation process of ATPG test vectors could be moved to RTL "with a very significant speedup".
To access DeFacto's HiDFT-SIGNOFF, click here