SAN FRANCISCO—Chip foundry Globalfoundries Inc. has selected Synopsys' Yield Explorer tool for use as part of its next-generation yield management system for faster yield ramp based on volume diagnostics, Synopsys said Wednesday (May 30).
According to Synopsys (Mountain View, Calif.), Yield Explorer automated volume diagnostics will allow Globalfoundries to quickly identify the dominant systematic failure mechanisms on early test chips as well as customers' chips, reducing the time to achieve desirable yield levels. Yield Explorer's ability to combine and analyze data from design, fab and test domains enables collaboration between Globalfoundries and its customers to identify failure mechanisms and activate process or design corrective actions, Synopsys said.
"Understanding and preventing the yield loss caused by design-process interactions is critical to ramp-up of designs manufactured on a new node," said Robert Madge, director of design enabled manufacturing at Globalfoundries, in a statement. "Yield Explorer is a valuable new addition to our advanced Yield Management capabilities."
Yield Explorer is designed to help users correlate yield loss to various design, fab and test attributes. The automated volume diagnostics in Yield Explorer are designed to be simple to deploy and work smoothly across a variety of design, fab and test outputs and data formats, according to Synopsys.
"Meeting yield targets for complex designs implemented on 28-nm and below technology requires understanding the complex interactions of design, lithography and process," said Howard Ko, senior vice president and general manager for Synopsys' Silicon Engineering Group.