Agilent Technologies Inc., Palo Alto, Calif., and the Department of Microelectronics at Peking University have opened a system-on-a-chip (SOC) engineering test center and SOC testing education center in Beijing. The centers are the latest facilities developed to support policies drafted by The State Council of China to encourage development in the country's growing semiconductor market.
The SOC Engineering Test Center is designed to fulfill various industrial testing requirements for scientific research projects by key national laboratories. The SOC Testing Education Center leverages the strengths of the Dept. of Microelectronics scholars and Agilent's test engineers to deliver fundamental, key technology and application-oriented training.
Peking University founded China's first semiconductor group in its physics department in 1958, and was one of the earliest cradles of large-scale IC development in China. In the 1970s, the Dept. of Microelectronics at Peking University introduced the first three-type 1K metal oxide semiconductor (MOS) dynamic random access memory (DRAM) device.