MOUNTAIN VIEW, Calif. -- Aehr Test Systems announced today it has received orders valued at $10 million from three Taiwanese companies for Aehr Test's MTX Massively Parallel Test products. The MTX systems will be used in production parallel test and burn-in of DRAMs.
The MTX system can fully functionally test thousands of devices at a time, said Rhea Posedel, president and CEO of Aehr Test Systems. It will also be able to accommodate future generations of memories such as Rambus DRAMs and Double Data Rate DRAM.
"The MTX memory testing solution performs the time-consuming functional tests of the traditional tester, off-loading up to 70% of the test time from the final tester," added Posedel. "As a result, we believe the MTX is one of the industry's most cost-effective solutions, testing over 10,000 Rambus DRAMs in one system and providing traditional burn-in as well. The MTX is able to test during burn-in, which enables manufacturers to detect intermittent failures that only occur during burn-in and would otherwise pass during a traditional final test."