Austin, Texas — National Instruments has introduced two 32-channel PXI Express-based digital instruments and an eight-slot high-bandwidth PXI Express 3U chassis for advanced automated test applications.
The PXIe-6544/45 selectable-voltage digital waveform generator/analyzers optimize test applications by supporting clock rates of up to 100 and 200 MHz, respectively. The PXIe-6545 provides typical streaming rates of 660 MB/s, making it one of the industry's fastest-streaming digital test products. The instruments make it easier for test engineers to conduct sophisticated analysis of high-speed semiconductor devices and high-definition (HD) multimedia components that require rapid transfers of large amounts of data to and from host memory.
The PXIe-1082 chassis, which claims to be the industry's first 3U eight-slot PXI Express chassis with seven PXI Express peripheral slots, complements the generator/analyzers with up to 1 GB/s per-slot bandwidth and up to 4 GB/s of total system bandwidth.
Because of the advanced operation of the PXIe-6544/45 modules, engineers now can accurately and automatically test faster semiconductor devices, such as ADCs, DACs, memory devices, ASICs and microcontrollers. Testing a 200 MS/s DAC, for example, previously required a high-speed pattern generator, an oscilloscope and a power supply.
With the PXIe-6545 generator/analyzer and PXIe-1082 chassis, engineers can perform characterization and production tests using compact, software-defined modular instrumentation. This approach provides greater flexibility by making it possible for engineers to programmatically select voltages of 1.2, 1.5, 1.8, 2.5 or 3.3 V; independently configure each of the 32 channels for input or output; and use the high-resolution onboard clock for subhertz frequency selection.
The data throughput capabilities of the high-speed PXI Express digital instruments and high-bandwidth chassis are ideal for testing many multimedia devices as well, including HDTV signals up to 1080p at 60 Hz, LCD screens, RF baseband devices and HD radio.
The PXIe-6544/45 modules include enhanced timing and synchronization features, such as an onboard direct digital synthesis (DDS) clock that provides subhertz resolution ranging from DC to 200 MHz. This helps engineers clock data generation and acquisition with higher resolution without using an external clock, eliminating the need for an additional high-resolution clocking device and external timing cables. The DDS also helps engineers manage test applications that require arbitrary clock frequencies.
Engineers can export the onboard clock to other instruments or import external clocks through the backplane of the NI PXIe-1082 chassis or through an SMB connector on the front panel of the generator/analyzers. With these features, engineers quickly can synchronize the PXIe-6544/45 modules with other analog or digital instruments for maximum correlation of generated signals and measurements across devices.
The PXIe-1082 eight-slot high-bandwidth 3U chassis features PCI Express lanes routed to every slot. The chassis provides four hybrid slots that engineers can use for either PXI Express or PXI hybrid-slot-compatible modules to maximize reuse of existing PXI modules. Designed for high-performance systems, the chassis offers an operating temperature range of 0 to 50 degrees Celsius and provides integrated system monitoring features, including power management, fan health and temperature monitoring, for the entire chassis.
For further information and data sheets visit www.ni.com/pxi.