CAMBRIDGE, UK On Thursday, 29 October, at 14:00 GMT, Keithley Instruments Inc., will host a free 45-minute online seminar about the fundamentals of testing semiconductor capacitance and voltage.
The webcast is free to attend, but registration is required, enabling engineers based in Europe to participate in the live event. The seminar will introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization.
It is recommended for engineers who are new to semiconductor materials and device testing and those that want to refresh their knowledge of the subject. After attending the seminar participants will have gained an insight into what C-V testing is, the types of devices C-V testing can be used to characterize, who can use it, and the challenges associated with making C-V measurements.
Lee Stauffer, Senior Staff Technologist for Keithley’s Semiconductor Measurements Group, will present the seminar and take questions from the audience at the end. Prior to joining Keithley, Lee’s career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.
Register now to access the webinar