This paper introduces Mentor Graphics' new Tessent product platform and focuses on its latest features in silicon test and yield analysis. The Tessent product platform is built on the foundation of the best-in-class test tools for each test discipline and brings these solutions together in a powerful test flow and hierarchical architecture that ensures total chip coverage, including logic, memory, mixed-signal and I/O. ATPG features such as low power test and Tessent TestKompress usability improvements with compression analyzer will be described. In addition, power-aware self-repair within Tessent MemoryBIST will be explained. Advanced yield analysis capabilities provided by the new Tessent YieldInsight product will be introduced along with how these are integrated with existing silicon verification and diagnosis tools.
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