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New challenges for LTE and MIMO receiver test

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KeithSchaub
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re: New challenges for LTE and MIMO receiver test
KeithSchaub   11/29/2010 9:17:59 PM
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MIMO is a key reason why test and measurement systems are having to increase RF pins/ports. Combine up to 8x8 MIMO for a single device with the need to be able to test multiple devices in parallel and its easy to see why test and measurement systems are being offered with 100+ RF pins. This was thought to be impossible (or at least highly unlikely) just 10 years ago, yet now systems can offer this capability and at a fraction of the cost. These systems and how we measure them are playing a large role in driving down cost and fueling the growth.

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