An integrated circuit entering production must be available in high volume to meet the potential demand. Even though bench testing may show good results, in production the device must be tested with automated test equipment (ATE).
Whatís more, before the designís release to production, it must undergo thorough characterization to verify that every tested device will fully meet its electrical specifications, as well as to uncover any process defects that could appear during the fabrication process. Here, we focus on mixed-signal device characterization, examining statistical techniques that ensure repeatability of test results, including testing over an ICís rated temperature extremes. Click to read the rest of this article on EDN.
David Patterson, known for his pioneering research that led to RAID, clusters and more, is part of a team at UC Berkeley that recently made its RISC-V processor architecture an open source hardware offering. We talk with Patterson and one of his colleagues behind the effort about the opportunities they see, what new kinds of designs they hope to enable and what it means for todayís commercial processor giants such as Intel, ARM and Imagination Technologies.