An integrated circuit entering production must be available in high volume to meet the potential demand. Even though bench testing may show good results, in production the device must be tested with automated test equipment (ATE).
Whatís more, before the designís release to production, it must undergo thorough characterization to verify that every tested device will fully meet its electrical specifications, as well as to uncover any process defects that could appear during the fabrication process. Here, we focus on mixed-signal device characterization, examining statistical techniques that ensure repeatability of test results, including testing over an ICís rated temperature extremes.
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