Santa Clara, Calif. - Emulation Technology Inc. is offering testing and debugging support for Micron Technology Inc.'s latest double-data-rate SDRAM memory devices with the availability of two new test clips. The clips provide test and design engineers with an accurate, hands-free means to test and debug Micron's DDR synchronous DRAM in TQFP and TSOP packages, the company said.
The test clips are said to be reliable and easy to use because they snap or piggyback onto the IC packages, providing an accurate and secure contact with the IC pins. The test points on top of the clips offer a quick connection to test cable assemblies, test probes or wire wraps, the company said.
The clips can be used with a variety of equipment, including logic analyzers and oscilloscopes. Their wedge-shaped conductors, manufactured with beryllium copper and kapton insulation, conform to the size and shape of each pin when inserted. The design also offers a redundant electrical contact to each pin because each wedge contains two conductors, Emulation Technology said.
The TQFP version, Clip-100-QF06-2, supports Micron's 64- and 128-Mbit DDR memories in thin quad flat packs. It is priced at $1,232. The TSOP offering, Clip-066-T222-2, supports Micron's 128-, 256- and 512-Mbit devices. It sells for $754. Delivery is stock to two weeks.
Call (800) ADAPTER (232-7837)