New Boundary-Scan Controller Sets 'Tri-standards' Supporting Selectable USB 2.0, Ethernet or FireWire Interface
Stevensville MDE---JTAG Technologies, a leading provider of IEEE Std. 1149.1 solutions for testing and programming high-density PCBs, announces a further ground-breaking extension of its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT 37x7/TSI (short for Triple-Serial Interface) this unit offers a "World's First" by supporting high-performance JTAG testing, on-the-move, via a choice of USB 2.0 (and 1.1), Ethernet or FireWire interfaces. The JT 37x7/TSI is available immediately with pricing starting at $4,000.
Following industry demands JTAG Technologies has developed a new, boundary-scan controller to satisfy the rapidly growing requirements for high speed In-System Programming (ISP) of flash memories and CPLDs and complex digital circuit testing. The new DataBlaster JT 37x7/TSI offers the user unsurpassed, sustained test clock speeds of up to 40 MHz by use of JTAG Technologies' proprietary ETT (Enhanced Throughput Technology) system and features a flash image buffer memory which may be expanded to 128 Mbits.
Supplied with the complementary QuadPOD, also from JTAG Technologies, the new DataBlaster/TSI offers four synchronized TAPs (Test Access Ports) able to support multi-TAP test targets (UUTs) or gang programming of four single TAP targets. QuadPOD is "low-voltage ready," programmable per TAP. Advanced technology from JTAG Technologies allows maximum test speeds at the target by incorporating high-speed signal conditioning, logic threshold adjustments and cable delay compensations in a compact, remote extension module.
The scalable DataBlaster JT 37x7/TSI range starts with the low-cost entry model JT 3707/TSI. This unit has the same high-speed 40 MHz test capability as the extended models JT 3717/TSI and JT 3727/TSI but is not fitted with an ETT module for flash ISP. The module can be added later, or the user can opt to purchase a JT 3717/TSI or JT 3727/TSI with ETT fitted as standard (and 64 Mbits or 128 Mbits of flash capacity, respectively). An additional feature of ETT is its flexibility in support of memories with various data-bus widths, from 1-bit to 64 Kbits. Serial PROMs using I2C and/or SPI bus are now more easily accommodated by the new DataBlaster JT 37x7/TSI architecture.
To provide maximum reverse compatibility, new DataBlaster/TSI units are fully compatible with existing JTAG Technologies test and ISP files. Compliant programs include JTAG Technologies test development software, flash and PLD development software and production tools for standalone and integrated test platforms. There is also support provided to execute tests under National Instruments' TestStand, LabVIEW and LabWindows/Cvi.
JTAG Technologies, based in Eindhoven, The Netherlands, is the global leader in innovative boundary-scan (IEEE Standard 1149.1) products. The company offers a broad line of software and hardware products supporting test preparation, test execution, test result analysis and in-system programming applications.