DFT Microsystems Unveils World's Fastest Jitter Test Solution For Up To 5 Gbps Data Rates
Compact DJ502 Module Transforms Outdated Automated Testing Equipment
Norristown, PA---DFT Microsystems introduces the semiconductor industry's fastest jitter and timing test solution. The DJ502 Module is a platform-independent jitter and timing test system that eliminates the compromises in test performance, reliability, cost and development time faced by leading semiconductor companies and test service providers.
"Over the past decade, Professor Gordon Roberts of McGill University researched the testing problems caused by the increased performance of semiconductors," said Alex Oscilowski, President and CEO of DFT Microsystems. "His research led to the founding of DFT Microsystems, where he is now the Chief Technology Officer, and the creation of the DJ502 Module."
Leveraging the work of Roberts and his technology development team, the compact DJ502 (3.8-in. x 4.2-in. x 1.1-in.) plugs directly into standard connectors on any device interface board (DIB). This ease-of-use is complemented by the module's platform independent design, which enables companies to use previously outdated ATE to test cutting edge semiconductors. The DJ502 sets a new standard for throughput, performing production jitter tests in just 4 milliseconds.
Unmatched in its ability to deliver multiple high speed signal generation and measurement channels close to the DUT, the DJ502 ensures the highest level of performance, accuracy and repeatability at data rates up to 5 Gbps. With its multiple processing engines local to both the DUT and the onboard measurement engines, the DJ502 delivers true local processing and decision-making capability to enhance any legacy or leading edge ATE.
Patented core technology in the DJ502 combines five Timing Generation Units (TGUs), five Timing Measurement Units (TMUs), and DSP hardware into a compact module which plugs directly into connectors on the device interface board. With the DJ502, designers and test engineers can use the same instrument for both production testing and device characterization. A simple and seamless software interface provides a direct serial connection to the host ATE digital channels for high throughput production testing. Stand-alone instrument capability is also provided by the DJ502's software for test program development and characterization testing.