Dallas, TexasSemiconductor test provider Pintail Technologies is releasing the latest version of its SwifTest 5.2 realtime statistical sampling software suite for semiconductor testing. This new version promises to reduce test cost, improve quality, and boost test efficiency. The company will also be supporting Teradyne test platforms; more on this in a moment.
The SwifTest family includes thee primary optional modules. One is the SwifTest-Monitor. It captures test results in realtime from the tester and pre-processes the parametric data. With support for local realtime alerts, it's a pre-requisite for Pintail's sampling, out-lier detection, and TestScape DBMS (database management system).
Another optional module is SwifTest-MX. It's a patented realtime statistical sampling tool. In use, it has proven to reduce test time by up to 40% in mixed-signal production at both probe and final test.
Next is Pintail's SwifTest-AQ module. SwifTest-AQ is a dynamic out-lier detection tool for reducing DPM (defect per million) by applying PAT (parts average testing) in realtime. It's popular for testing automotive electronics at both probe and final test. PAT enhancements dynamically eliminate out-liers during test, and thus reduce field failures.
Support For Teradyne
Key new features in the SwifTest 5.2 release include Teradyne Flex Support. SwifTest is now available for installation on Teradyne's latest FLEX ATE platforms, increasing Pintail's platform support to include most Teradyne systems, LTX Fusion, Cadence systems, and Agilent's 93000 Series.
A geographic wafer analysis option has also been added. It's for optional cluster analysis on wafers during on-line PAT processing. It includes four modes for performing neighborhood: failing die weighting, PAT out-lier die weighting, software bin die weighting, and hardware bin die weighting.
pintail is also offering its SwifTest Commander. SwifTest Commander is a Web-based information console for managing all running instances of SwifTest across a test floor. Information about current license usage, current processing lots, and specific statistical information is available to facilitate management of multiple installations of SwifTest.
An existing Device Profile Designer also gets new features. These have been added to streamline the preparation of test programs for realtime sampling or realtime PAT. Likewise, an Agilent Data Conduit has been enhanced with improved functions to support the Agilent 93000 tester platform.
There are also new triggers and alerts. For example, realtime monitoring now includes capabilities to monitor site-to-site variations, lot yield, and out-lier counts, in addition to the earlier triggers and alerts. SwifTest also now includes lot classification. It automatically classifies lots as First Pass, Correlation, Setup, Engineering, Retest, QA, or unknown types. That supports downstream applications such as Pintail's TestScape DBMS.
Additional details are available by clicking here.
For more info, contact Pintail Technologies, 5800 Granite Parkway, Suite 820, Plano, Texas 75024. Phone: 972-208-2800. Fax: 972-464-5835.
Pintail Technologies, 972-208-2800, www.pintail.com