SAN FRANCISCO Synopsys Inc. Wednesday (Sept. 27) said enhancements to its TetraMAX automatic test pattern generation (ATPG) product enable a typical speedup of three fold or more in runtime performance across all design styles compared with the previous version.
According to Synopsys (Mountain View, Calif.), the faster ATPG runtime for both stuck-at and transition delay testing provides productivity gains for designers involved in creating high-quality manufacturing tests.
Graham Etchells, director of test marketing at Synopsys' implementation group, said through a statement that this enhancement marks the second major upgrade for TetraMAX in the span of one year.
"Taken together, the two most recent TetraMAX versions have achieved on average more than a 12X speed-up in ATPG results," Etchells said. "With this order-of-magnitude improvement in performance, our customers benefit from creating the same high-quality test patterns in just a fraction of the time."
Synopsys said TetraMAX now efficiently generates patterns for the very largest designs. TetraMAX does not require partitioning of a large system-on-chip (SoC) design to run ATPG separately on each block, Synopsys saidit can generate patterns for the entire design at once.
Synopsys said the TetraMAX performance improvements enable designers to create more types of tests in the same amount of time it once took to generate only traditional stuck-at patterns.
TetraMAX provides automated links to Synopsys' PrimeTime signoff suite to enable designers to translate both timing exceptions and critical timing, Synopsys said.