Cupertino, Calif. Verigy has introduced the V93000 Nanoelectronics Digital solution that performs structural and functional test for wafer sort and final test of advanced digital ICs at 65 nm and below. The test system enables users to collect diagnostic and parametric data required for testing nanoelectronics.
By providing accurate diagnostic and parametric data, the Nanoelectronics Digital solution allows manufacturers to target new failure mechanisms that reduce manufacturing yield at 65 nm and below, which is a key challenge in the migration to new smaller nodes, said Verigy.
Verify explained as companies move to process nodes at 65 nm and smaller, manufacturers are facing test challenges caused by new failure mechanisms such as transition and bridging faults, design process interaction and inter- and intra-die variations. The challenge is made greater by growing scan vector volumes, plus more use of on-chip compression and built-in self-test (BIST) structures, added the company.
In addition, measurement accuracy also becomes more critical due to the lower voltages and higher speeds typical with smaller geometries, together with the integration of performance analog and DC. With challenging initial yields in nanoelectronics, accurate measurements have taken on new importance for closing the loop between test and design to enable rapid yield learning and improvement, said Verigy.
The V93000 Nanoelectronics Digital solution includes the following compact test head-based configurations:
- Pin scale 400 digital pin card, scaling from DC IO to 533 Mbits/s
- Integrated large fail-data capture and ultra-fast data transfer
- DC scale DPS32 32 channels per card for testing multiple power, domains in multi-site, and fast synchronous triggering for improved repeatability and high throughput
- STIL link package
- Integrated TIA per pin.
The Verigy V93000 platform provides a scalable architecture for testing SoCs, system-in-packages (SIPs) and high-speed memory devices. The test system provides multi-site capabilities, with data rates up to 12.8 Gbits/s and supports a full range of digital, mixed-signal and RF applications. It provides low cost-of-test for wireless applications such as cellular, WLAN, WiMax, and UWB.
Pricing: The Nanoelectronics Digital solution starts at $499,000.
Product information: V93000