Santa Clara, Calif. Advantest Corp. has introduced a 2 Gbits/s source synchronous interface test system, which offers high-accuracy testing for source-synchronous interfaces such as DDR2/DDR3, which are found in most CPUs and memory chipsets. The 2GDM module is part of a suite of SoC test solutions for Advantest's T2000 open-architecture test system.
The 2 Gbits/s Digital Module (2GDM) test solution, a complete functional AC/DC test system for the T2000, addresses the industry's need for a SoC tester that can perform high-throughput at-speed functional test on source-synchronous interfaces, said Advantest. It enables full functional testing of high-speed source-synchronous interfaces up to a speed of 2 Gbits/s on the T2000 OPENSTAR standard-based test platform.
Advantest said its unique edge shift and multi-strobe capabilities, which enables real-time testing of source-synchronous interfaces, significantly speed timing margin test, providing for single pass testing of most source-synchronous and timing parameters. The high-density test module provides 36 input/output (I/O) channels, each with digital drive, digital compare, and an additional FlyBy compare channel, along with DC and frequency measurement capabilities.
Availability: The 2 Gbits/s Digital Module will be available in January 2008.
Product information: T2000
Advantest Corp., www.advantest.com