Venice, Florida — Ponte Solutions announced an enhanced YA
System, version 0801, offering new defect analysis capabilities and
enhanced features. This new YA release can now analyze butted
contacts, diffusion contact to gate shorts, source-drain shorts, and
isolated contacts and vias. In addition, Ponte has enhanced the ease
of use for its embedded memory analysis capabilities.
By applying the YA System's "what-if" capabilities designers can
compare the sensitivity of their design, and each major design block, to changes in the defect rates for different DFM mechanisms. Moreover, by providing a quantitative Yield Sensitivity Index (YSI) to different design cockpits, from layout editors to place
and route suites, the YA system lets design teams determine the correct layout solution to use.
The new release further enhances the value of Ponte's YA System at the
full-chip level by providing systematic failure analysis in addition
to the prior random defect analysis capabilities. Full-chip analysis also allows
trade-off scenarios between different memory redundancy schemes for
all the different memory types used in an SoC, a capability unique to
the YA System. When designers couple the memory analysis with the
"what-if" capability, they can optimize memory redundancy schemes
considering different defect projections.
The 0801 version of the YA System is in beta evaluations at key
customers. It will be available to the general market in February