Cleveland, OhioKeithley Instruments Inc. has introduced Keithley Test Environment Interactive (KTEI) V7.1 for its Model 4200-SCS Semiconductor Characterization System.
This software upgrade includes support for testing higher power semiconductor devices. With support for low-level device characterization through higher power devices, the Model 4200-SCS is one of the most complete semiconductor characterization analyzer on the market, making tough measurements easy and lowering the cost of test by protecting capital equipment investment, according to Keithley.
The KTEI V7.1 upgrade incorporates a number of features and functions that broaden the capabilities of the Model 4200-CVU (Capacitance-Voltage Unit), including software support for characterizing higher power semiconductor devices at up to 200VDC (or 400V differential) and up to 300mA. This capability is useful for engineers working with laterally diffused MOS (LDMOS) and other higher power semiconductor devices in automotive, display, MEMS, and other high power applications.
KTEI V7.1 also adds software support for other new functions, including differential DC bias; quasistatic C'V testing; an expanded set of device test libraries; and a variety of software enhancements designed to speed and simplify testing.
Pricing and availability: KTEI V7.1 is available immediately as a free upgrade for existing Model 4200-SCS systems and can be ordered by contacting a Keithley sales engineer.
For more information: Click here.
Keithley Instruments Inc., www.keithley.com