Agilent Technologies has releases two application notes, plus a seminar on CD, covering some key RF and related areas; all are free:
"Improved Methods for Measuring Distortion in Broadband Devices" illustrates the importance of characterizing broadband commercial and defense systems for linearity. The information focuses on the tests used to determine the level of a system's distortion and how they relate to Intermodulation Distortion (IMD) and Intermodulation Distortion Noise (IMDN). It summarizes with the test methods and the instruments used. This application note can be downloaded at http://cp.literature.agilent.com/litweb/pdf/5989-9880EN.pdf.
"Non-Contact Measurement Method for 13.56 MHz RFID Tags" was created for engineers who design and test for these increasingly common RFID tags. The document gives an overview of the non-contacting measurement method using network analyzers. To help engineers perform accurate measurements, the application note provides data on measurement errors as well as repeatability data by comparing an alternative method using a spectrum analyzer with a tracking generator function. A customer case is introduced from Sony Corporation's FeliCa™ Evaluation Lab that uses an Agilent ENA-L network analyzer as a standard instrument for testing their FeliCa RFID tags. This application note can be downloaded at http://cp.literature.agilent.com/litweb/pdf/5990-3443EN.pdf.
David Patterson, known for his pioneering research that led to RAID, clusters and more, is part of a team at UC Berkeley that recently made its RISC-V processor architecture an open source hardware offering. We talk with Patterson and one of his colleagues behind the effort about the opportunities they see, what new kinds of designs they hope to enable and what it means for today’s commercial processor giants such as Intel, ARM and Imagination Technologies.