Useful for parallel testing of multipin semiconductor devices, the PXIe-4143 SMU (source- measure unit) from National Instruments provides four channels in a single-slot 3U PXI Express module. It also features NI SourceAdapt technology, which allows engineers to custom-tune the SMU response for any DUT load.
The PXIe-4143 offers four-quadrant operation to source or sink up to ±24 V at ±150 mA. In addition, the unit achieves a sample rate of up to 600 ksamples/s to measure fast transient responses. Four current-measurement ranges are available—10 µA, 100 µA, 1 mA, 10 mA, and 150 mA—with a sensitivity of 10 pA for accurate characterization of idle currents.
Join our online Radio Show on Friday 11th July starting at 2:00pm Eastern, when EETimes editor of all things fun and interesting, Max Maxfield, and embedded systems expert, Jack Ganssle, will debate as to just what is, and is not, and embedded system.