A new interference test set and other enhancements to Tektronix’
BERTScope bit-error-rate testers and PCI Express test software give silicon,
host, and card designers a powerful automated transmitter/receiver compliance
and debug platform for the PCI Express 3.0 bus standard.
At speeds of 8 Gbps, PCI Express 3.0 testing involves
complex receiver stress conditioning, BER compliance testing, and numerous
transmitter compliance tests. According to Tektronix, its updated platform
provides the industry’s most integrated level of support for physical-layer
test automation and debug of PCI Express 3.0.
For PCIe 3.0 receiver testing, stressed pattern generation
as required by PCI-SIG test specifications are automated and now include
integrated support for clock multiplication and eye-opening tests.
Additionally, DUT loopback control is automated. New tools that enable these
capabilities include the DPP125C digital pre-emphasis processor, which adds
pre-emphasis to the stressed pattern; the BSAITS125 integrated interference combiner with variable
ISI (intersymbol interference); and the BSAPCI3 automated calibration,
loopback, and link-training software.
To accelerate PCIe 3.0 transmitter testing, Tektronix has
incorporated the PCI-SIG’s SigTest utility software for compliance testing
directly into its TekExpress automation framework on the DSA70000 series
digital oscilloscopes. With this integration, the updated PCE3 software
automates test instrumentation and DUT control, pattern validation, data
acquisition, and analysis with SigTest and allows custom reporting of multiple
SigTest results. The PCE3 software also provides a seamless transition to
debugging when compliance testing fails.
More information: www.tek.com/technology/pci-express