Tektronix has introduced a series of programmable pattern generators and
bit error detectors with up to four channels for optical and serial
data-communications testing on signals as fast as 32 Gbps. The PPG3000
series of pattern generators and PED3000 series of bit error detectors
provide multichannel pattern generation with channel-specific data
programming, allowing engineers to perform critical margin testing on
standards like 100G Ethernet.
For testing coherent optical modulation formats, such as DP-QPSK, the
PPG3000 pattern generator with its four phase-aligned channels can be
used in conjunction with the Tektronix OM4000 coherent lightwave signal
analyzer to validate coherent modulation formats in real time. For BER
(bit error rate) testing, the PED3000 error detector can be teamed with
the PPG3000 to provide up to 32-Gbps BER analysis with multichannel
support for quick identification of crosstalk issues common in multilane
The PPG3000 series comprises
six models, including generators with 30-Gbps or 32-Gbps speeds and one,
two, or four channels. Available with either one or two channels, the
PED3000 series of error detectors enables stressed receiver testing of
multichannel data communications designs. These detectors combine
sensitivity of less than 20 mV measured at 30 Gbps with data rates
ranging from 32 Mbps to 32 Gbps.
Both the PPG3000 series of
pattern generators and the PED3000 series of error detectors will be
available in late December. Prices start at $85,000.