Advantest Corporation announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and the HA5100CELL, based on the Harmonic architecture, for wafer test. Together, the tools aim to support for high-capacity, high-speed next-generation NAND flash memory devices, from the front end to the back end.
The Harmonic Architecture (HA) platform combines a tester and prober in a single tool, and four test cells into one. With the capability to test four wafers at once, the HA5100CELL is a dedicated NAND flash memory tester which offers a reduced footprint 1/4 the size of previous systems. It’s operating frequency of 100MHz with a maximum parallel test capacity of 6,144 DUTs. (The HA5100ES, an engineering system for R&D device evaluation, is also available.)
Advantest’s T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications. The T5773’s operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773’s is designed to provide significant power and floorspace savings. (Advantest also offers the T5773ES, an engineering system for R&D use.)
Key Specifications: HA5100CELL
Target Device :NAND flash memory (wafer test)
Parallel Test Capacity : 6,144 DUT (1,536 DUT x 4 stages)