The RFID Xplorer test system from Austrian manufacturer CISC Semiconductor measures UHF RFID tag sensitivity, communication range, and backscatter. The unit operates over a frequency range of 800 MHz to 1 GHz and can achieve a measurement speed of less than 1 second per frequency running the supplied software on an appropriate computer. Measuring 160×205×50 mm, the RFID Xplorer is designed to be portable, and according to the manufacturer, dismantling and setup can be accomplished within minutes.
The RFID Xplorer is available in two versions: one for testing in open areas and a high-precision bundle for measurements conducted in an RF-controlled environment using a portable RF test chamber. In addition to measurement software, the system comes with a reference tag for self-calibration.
RFID Xplorer is available for approximately $20,000 (15,000€) until June 20, 2012.
Join our online Radio Show on Friday 11th July starting at 2:00pm Eastern, when EETimes editor of all things fun and interesting, Max Maxfield, and embedded systems expert, Jack Ganssle, will debate as to just what is, and is not, and embedded system.