The RFID Xplorer test system from Austrian manufacturer CISC Semiconductor measures UHF RFID tag sensitivity, communication range, and backscatter. The unit operates over a frequency range of 800 MHz to 1 GHz and can achieve a measurement speed of less than 1 second per frequency running the supplied software on an appropriate computer. Measuring 160×205×50 mm, the RFID Xplorer is designed to be portable, and according to the manufacturer, dismantling and setup can be accomplished within minutes.
The RFID Xplorer is available in two versions: one for testing in open areas and a high-precision bundle for measurements conducted in an RF-controlled environment using a portable RF test chamber. In addition to measurement software, the system comes with a reference tag for self-calibration.
RFID Xplorer is available for approximately $20,000 (15,000€) until June 20, 2012.
CISC Semiconductor product web page