Today is Halloween and I have 900 pieces of candy to give away this evening. For two hours, the street will be full of children, hundreds of them, looking for tricks and treats (mostly treats). On top of that, we here in Boston are basking in the glow of yet another World Series championship, the third in 10 years. What could be better than that?
Why, a roundup of technical articles at EDN's Test & Measurement Design Center in October, of course.
This month features two articles on how to view that nasty reality known as jitter, which limits signal integrity in high-speed digital systems. Daniel Chow, a longtime contributor at DesignCon, shows us The many faces of jitter. There are several ways to express jitter, and this article shows how they relate to each other.
Chow follows with Jitter's faces: Random, periodic, and ISI where you can see videos showing jitter in action. Chow also posted The basics of digital signal spectra, a tutorial that explains what digital signals look like in the frequency domain.
Continuing on the signal-integrity theme is How to think in dB. Signal-integrity evangelist Eric Bogatin explains the concept of the decibel and why it's so useful in electrical engineering.
EMC engineer Kenneth Wyatt posted two articles in October. Wyatt, a fan of low-cost test equipment, surveys pocket-sized oscilloscopes in Try an oscilloscope for under $200
. Just this morning, Wyatt posted Measuring resonance in cables
where he shows how to use simple tools to measure resonance in cables and other objects that act like antennas.
Aubrey Kagan had a measurement problem. He needed to monitor voltage and current inside a closed controller panel. In Wireless oscilloscope sends data to a tablet, Kagan explains in an interview how he used Bluetooth and a digitizer board he designed to collect and send data, and why he chose an Android tablet over an iPad as the display.
Speaking of digitizers, meaning oscilloscopes, Arthur Pini -- who recently retired from Teledyne LeCroy -- explains how to Measure vector and area with an oscilloscope X-Y display.
We also featured articles on bench instrumentation. For Inside a high-power test fixture, designers at Keithley Instruments give us a look inside a high-power-device test fixture and explain the safety aspects of its design. You can also learn about how to specify and use gauss meters and flux meters in Use gaussmeters and fluxmeters for manufacturing quality by Jeffery Dierker, a senior engineer at Lake Shore Cryotronics.
In addition to these and other technical articles, you'll find products and blogs at EDN's Test & Measurement Design Center
. Blogs include All Things Measured
by Chris Grachanen, Everyday Measurements
by Luke Schrier, Test Cafe
by our resident modular instrument expert Larry Desjardin, and, of course, Rowe's and Columns
. I'll feature other blogs next time.
— Martin Rowe, Senior Technical Editor