On Wednesday, January 29 at DesignCon 2014, EDN announced the winners of the annual Best in Test awards and the Test Engineer of the Year. EDN's editors selected the finalists in each of ten categories and voted in December 2013. The product categories are:
- Manufacturing test/ATE
- Data acquisition
- Handheld/portable test
- Machine vision/inspection
- Network test (wired, wireless, hybrid, optical)
- RF/microwave test
- Semiconductor test
- Signal integrity/high-speed test
- Software/embedded test
- Test support: programmable power supplies, signal Generators, etc.
Read the complete article on EDN, which includes the overall reader selection for test product of the year.
At the same ceremony, EDN also announced the winner of the Test Engineer of the Year award.
Dr. Daniel Chow is an expert at measuring high-speed digital signals, but he didn’t start his career that way. His work at Apple, Altera, nVidia, and Wavecrest includes defining the design, testing, and validation methodologies for signal integrity and power integrity in high-speed components and silicon devices.
Read the rest at From Sensing Weapons to Measuring Jitter.