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Designing an ATM Chip
Using embedded array technology, engineers at Fujitsu Microlectronics were able to enhance the design of an existing ATM chip.by Rajesh Varshani and Barry MarshWith asynchronous transfer mode (ATM) standards and technology evolving at exceptional rates, designers at Fujitsu Microelectronics (Manchester, England) wanted to enhance an existing ATM design and implement it by the fastest means possible. Embedded arrays have long offered flexibility coupled with fast turnaround, but could they be used for the latest version of a complex ATM switching device? Among the many critical issues involved in this choice were speed, device complexity, power consumption, and the ability to transfer previously developed intellectual property into the embedded-array technology. Critical implementation issues included the need to floorplan the device's layout so that pinouts support easy matrix expansion of the ATM switch architecture. The ATM switching device in this project is the most recent version of Fujitsu's Self-Routing Switch Element IC, the SRE-L. The company chose the 0.5-µm embedded-array technology of its ASIC group to implement the device. The key reasons for choosing this technology included a significant reduction in power consumption and higher density, thus leading to a more cost-effective implementation. Fujitsu had implemented the original SRE as a 0.8-µm standard-cell device. Deciding on an embedded array Once the business decision was made that it would be extremely valuable to get the SRE-L to market sooner than a standard-cell implementation would allow, Fujitsu designers had several technical issues to evaluate before committing to an embedded-array approach. One issue was speed, but the device does not have to operate as fast as its 155-Mbps speed might suggest. Although ATM utilizes a serial data flow on the network side, inside the switching hub all data paths are 8-bit parallel, permitting the SRE-L to run fast enough to deliver a maximum bandwidth of 300 Mbps per port. More of a concern was the complexity of the SRE-L. The fact that the design has clock trees fanning out to approximately 3,600 flip-flops gives an indication of the design's complexity. Just as crucial were the blocks of RAM needed for buffering. Fortunately, Fujitsu embedded arrays were available that could supply both the necessary gate counts and the embedded RAM capacity. The design's complexity raised questions about power consumption--probably the most critical aspect of the implementation decision. Customer requirements in conjunction with packaging options establish the device's maximum allowed power consumption. The resulting power specification made it imperative to use a 3.3-V core, which the CE51 technology provides. Designers generally think of deep submicron technology as a way to boost a device's speed. In the case of the SRE-L, however, the ability of small geometries to reduce power consumption proved more valuable. The complexity and power constraints narrowed the designers' consideration to Fujitsu's 0.5-µm CE51 embedded array family. At 1.2 µW per MHz and as many as 753,768 available gates, these devices could stay within the power budget while delivering the speed, gate count, and RAM capacity the design required. A further consideration was whether the intellectual property in the original SRE could be reconfigured for implementation in the CE51 family's on-chip resources. Since the original SRE was designed in HDL format, it was a simple task to retarget the design to CE51 using logic synthesis.
One ATM cell consists of 53 bytes, or seven words. The RAM size of 1,024 words by 64 bits allows a capacity of 146 cells. The RAMs' size, aspect ratio, and pin positions dictate the device's floorplan. The floorplan was also affected by the need for a pin assignment that permits simple interconnect of several SREs in matrix fashion on a PCB. Figure 1 shows the resulting floorplan. As the floorplan shows, the SRE-L includes boundary scan-test circuitry compliant to IEEE1149.1 (JTAG). Embedded designs such as this one inherently contain some element of risk because the RAM positions are fixed before the final netlist is released from the designer. Typically, a customized master-slice is designed and then held in a pre-metalized condition. In parallel with wafer fabrication, designers release the final netlist, which is laid out. When the final verification process completes successfully, the layout data set is sent to the factory where the final masks can be etched on the array. The ASIC engineer, together with the designer, must position the RAM with absolute certainty; otherwise, there is a risk of having unusable master-slice wafers. The tool environment that supports the CE51 embedded array family includes a program that inserts clock trees into a design's gate-level netlist. The technology makes use of a two-layer clock-tree structure, comprising global and local clock trees. These trees are driven by global and local buffers, respectively (see Figure 2). The flip-flops driven by a local buffer are referred to as a cluster. The largest local buffer can drive a cluster of as many as 160 flip-flops, and a global buffer can drive 10 locals. It follows that a global buffer drives a maximum of 1,600 flip-flops. Thus two global buffers are driven at the clock start point to handle the 2,300 commonly clocked flip-flops in the SRE-L. The clock insertion tool requires the designer to either specify all the clock start points in the netlist or insert a special dummy cell into the netlist to notify the tool of the clock start point. The designer specified the clock start points in this design. When creating the clock tree, the insertion tool has the ability to delete any inverters or true buffers that the synthesis tool inserts. Upon execution of the program for the 2,300-flip-flop clock tree, the tool generated the clusters based upon the netlist's logical hierarchy. Because this design's logical hierarchy was not identical to the physical hierarchy, as is often the case, designers changed the clustering as needed. The adjustments to the clustering were then fed back into the insertion tool so it could generate the final clock trees and produce the clock-inserted netlist. Fujitsu's layout tool is designed to guarantee local buffer clock skew of less than 150 ps. To help verify timing, designers obtained an estimated standard delay format (SDF) file to verify the clock trees and perform pre-layout simulation and timing verification. When the errors found in these simulations were corrected in the netlist, the design went into layout. The embedded array layout The first step of validation is to expand the netlist and create a layout database. The resulting array is brought up onto the workstation and layout begins. In the SRE-L layout, an engineer placed the embedded RAMs first, then placed the power grid around the RAM. The global and local clock buffers were manually placed in optimal positions to minimize skew across the global network. An engineer did the global-to-local clock routing, followed by tentative placement of the flip-flops on flip-flop bars around the local clock buffers. The bars were placed within a 2-mm distance of the local buffer, which guarantees the local clock skew of 150 ps. This low level of skew in turn guarantees "shift-register" operation between flip-flops without any timing problems. With the main elements of the design in place, an engineer ran a cell placement program based on a simulated-annealing algorithm. This program placed the glue logic as well as performed the final flip-flop placement. With the flip-flops positioned, the local-buffer-to-flip-flop routing could be done. At this point, engineers had the layout tool generate a Manhattan-based SDF file with accurate clock-network timing. This intermediate SDF file generally proves to be extremely useful, as it is accurate to within 5 percent of the final routed values and allows designers to commence evaluation without waiting for the full chip routing. In the case of the SRE-L, timing problems were found and corrected. In the meantime, an engineer ran the full routing of the device and generated post-layout SDF information. Static timing verification The timing verifier program in the Fujitsu tool environment was used to check for timing problems in the SRE-L. The timing verifier allows users to specify the input stimulus, process variation, and delay-magnification values--multiplying factors to account for process, temperature and voltage-supply variations. The tool also allows users to hold specific parts of the design static. This capability is essential in designs such as the SRE-L because it allows designers to suppress any timing violations that might occur due to signal combinations that are impossible in actual operation (false paths). The static timing verification process requires at least four runs to find all errors: setup error detection at min and max delay magnification (DMAG) and hold-time error detection at min and max. For the SRE-L, each of these four main runs was further subdivided into runs that eliminated false paths, for a total of 16 separate verification runs. This approach found all of the potential timing problems in the SRE-L. With the timing errors corrected, the design was released to fabrication. A working device was obtained on the first pass. By using an ASIC methodology and reusing existing ATM intellectual property, Fujitsu quickly delivered an enhanced, cost-effective solution to market. This design serves as an example of an ASIC methodology fulfilling what has traditionally been considered an standard cell (ASSP) application. Rajesh Varshani is an ASIC design engineer at Fujitsu Microelectronics Ltd. (Manchester, UK). Barry Marsh is the director of communications products at Fujitsu Microelectronics Inc. (San Jose, CA).
To voice an opinion on this or any Integrated System Design article, please e-mail your message to michael@asic.com. integrated system design August 1996[ Articles from Integrated System Design Magazine ] [ ICs and uPs ] [ Custom ICs and Programmable Logic ] [ Vendor Guide ] [ Design and Development Tools ] [ Home ] For more information about isdmag.com e-mail marcello@isdmag.com For advertising information e-mail amstjohn@mfi.com Comments on our editorial are welcome Copyright © 1996 Integrated System Design Magazine |
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