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IoT Design Challenges for 2016: From Sensors to Software Security
Date: 5/9/2016
More information and registration
What are the engineering and design challenges in creating successful IoT (the Internet of Things) devices and then connecting them to the Internet? Rick Merritt talks with two experts about the tools and best options for designing IoT devices.

Host:

Rick Merritt EE Times Silicon Valley Bureau Chief
Guests: Christopher Martin Director Engineering and R+D, Bosch Research and Technology Center, Pittsburgh, PA
See a 2013 YouTube talk by him here.
Anthony Rowe Associate Professor, Electrical and Computer Engineering and CyLab, Carnegie Mellon University
See a 2016 YouTube talk by him here.

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Embedded Vision: How a Car Sees
Date: 4/8/2016
Host:
Jeff Bier, Embedded Vision Alliance
More information and registration
All about embedded vision, with a focus on self-driving cars: Jeff Bier, the founder of the Embedded Vision Alliance, will talk with Embedded.com's Max Maxfield about what goes into embedded vision for cars, plus other interesting developments in the field happening at Google and NASA, among others.
What Does Automotive Industry Want from 5G?
Date: 3/28/2016
Host:
Junko Yoshida (EE TImes) and guests
More information and registration
What does the automotive industry want from 5G? Junko Yoshida and guest panelists from the automotive and semiconductor industry discuss what vehicle-to-vehicle and vehicle-to-infrastructure will demand from a 5G wireless communications.
PAM4 Signal Modulation — No Pain, No Gain; with Ransom Stephens
Date: 1/15/2016
More information and registration
As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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