Analyzing the Device Parasitics Sensitivity and Accuracy of Calibre xACT 3D Field Solver Extraction

As process technologies advance, a parasitic extraction tool requires more sophisticated extraction capability to obtain the effective sensitivity analysis users need, while still meeting schedules and accuracy specifications. Mentor's new parasitic extraction tool, Calibre xACT 3D, enabled the Semiconductor Technology Academic Research Center (STARC) to easily and accurately extract the capacitance adjacent to a device on an individual component basis, and create a new reference based on the extraction. With its unique technology and high-quality performance, Calibre xACT 3D can be an integral part of the sophisticated extraction flow needed for today's complex designs and advanced process technologies.

Note: By clicking on the above link, this paper will be emailed to your EE Times log-in address by Mentor Graphics.