Education & Training

Technical Papers Spotlight

Open Standards and Product Differentiation

System-Level and Application Specific ESD Protection Guide

Dangers of Aftermarket Counterfeit Battery Packs

Leveraging ADC Technology to Capture, Compute, and Communicate in Microcontroller-Based Embedded Systems

Addressing the Complexity of "Smart" Devices Through Low Power Hierarchical Design

Accelerating, Analyzing, and Securing Network Traffic

Build, Borrow, Buy: New Approaches to Addressing Software Complexity

Integrated ZigBee Radio Implementation and Testing

Fundamentals of a Mixed Domain Oscilloscope

Coherent Optical Signal Generation with High-Performance AWG

Radar Processing: FPGAs or GPUs?

High Performance Embedded Computing and Its Impact on Mil/Aero Applications

Improve Quality and Decrease Time to Market with Better Requirements Management

Why Honest Weigh Scales Are Application Specific

Protecting People, Data, and Revenue with Security-Optimized Embedded Designs: Part 2

Linux System/User Space Virtualization for Next Generation Real-time Embedded Applications

Designing High-Efficiency LED Driver Circuits Using the NCL30051

Enhanced, High-Efficiency Power Factor Controller

Using Plots for HDL Debugging as a Powerful Alternative to Traditional Waveforms

Merging High-Performance Instruments and FPGAs for Best-in-Class WLAN Measurements

Technical Papers

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Tech Paper Title	Type	Date
Next Generation I/O Bus PCI-Express BER Test Solution Agilent Technologies	Product Paper	12/14/2005
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specifications Agilent Technologies	Product Paper	12/14/2005
Second Generation PCI Express Testing with the N4903A High-Performance Serial BERT (J-BERT) Agilent Technologies	Product Paper	12/14/2005
Physical Layer Testing of Passive Optical Network (PON) Modules Agilent Technologies	Product Paper	12/14/2005
Jitter Analysis Techniques for High Data Rates Agilent Technologies	Product Paper	12/14/2005
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode Agilent Technologies	Product Paper	12/14/2005
Jitter Generation and Jitter Measurements with the Agilent 81134A Pulse Pattern Generator and 54855A Infiniium Oscilloscope Agilent Technologies	Product Paper	12/14/2005
Advanced Jitter Generation and Analysis up to 3.35 Gbps with the Agilent 81134A Pulse Pattern Generator and 86100C Infiniium Wide-Bandwidth DCA-J Oscilloscope Agilent Technologies	Product Paper	12/14/2005
Radar Distance Test to Airborne Planes Agilent Technologies	Product Paper	12/14/2005
The Dual Clock Gbit Chip Test Agilent Technologies	Product Paper	12/14/2005
Magneto-Optical Disk Drive Research Agilent Technologies	Product Paper	12/14/2005
Simulation of Jittering Synchronization Signals for Video Interfaces Agilent Technologies	Product Paper	12/14/2005
Total Jitter Measurement at Low Probability Levels, Using Optimized BERT Scan Method Agilent Technologies	Technology Paper	12/14/2005
6 Tips for Successful Logic Analyzer Probing Agilent Technologies	Technology Paper	7/22/2005
Selecting an I/O Architecture for Your FPGA Design Agilent Technologies	Technology Paper	7/22/2005

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All papers are reviewed by EE Times staff. If approved for posting, we'll send you a link as to where the paper can be found on the site. All papers must be technical in nature; Press releases, Product announcements, PowerPoint presentations, pamphlets, incomplete documents/abstracts will not be accepted. For more information, contact Emily Soucy.