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Tech Paper Title Type Date
Method for Checking Block GDSII Against LEF Obstructions
Freescale Semiconductor
White Paper 3/26/2012
Characterization of the Power Management Unit
Freescale Semiconductor
White Paper 3/13/2012
Sub-threshold Leakage Reduction Through Ground Bounce Control
Freescale Semiconductor
White Paper 12/20/2011
Efficient Migration of Verilog Testbenches to UVM
Freescale Semiconductor
White Paper 12/1/2011
Software assisted snoop containment for Packet Processing Applications
Freescale Semiconductor
White Paper 11/9/2011
The Quest for a Rugged Transistor
Freescale Semiconductor, Richardson RFPD
White Paper 10/1/2011
Detection of Over-Testing or Under-Testing by Phase Shift Comparison
Freescale Semiconductor
White Paper 9/2/2011
QorIQ AMP Delivers More than Moore
Freescale Semiconductor
Product Paper 9/1/2011
An Automated Physical Design Flow Architecture
Freescale Semiconductor
White Paper 8/18/2011
Verification of Data Eye Width Variation in Differential Serial Protocols
Freescale Semiconductor
White Paper 8/15/2011
Unified Test Plan: Efficient Solution for Faster and Enhanced IP Maturity
Freescale Semiconductor
White Paper 8/11/2011
A Platform Solution with Advanced Security for Automotive Body Electronics Applications
Freescale Semiconductor
Product Paper 8/1/2011
Energy efficiency for networking end points
Freescale Semiconductor
White Paper 3/14/2011
A Novel Approach to Catch Boundary Optimization Using Logic Equivalence Checking
Freescale Semiconductor
White Paper 2/8/2011
Low Power Integrated Spare Module Placement for Efficient ECO Implementation
Freescale Semiconductor
White Paper 1/6/2011

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All papers are reviewed by EE Times staff.  If approved for posting, we'll send you a link as to where the paper can be found on the site.  All papers must be technical in nature; Press releases, Product announcements, PowerPoint presentations, pamphlets, incomplete documents/abstracts will not be accepted. For more information, contact Emily Soucy.