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New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA

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Available On-Demand

Original Air Date

April 19, 2011

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Agilent Technologies

Duration:60 min

Overview:
Characterizing electronic components and circuits becomes more important to design high-reliability products. For that reason, engineers are confronted with challenges such as evaluate broad frequency range from near-DC to RF, reduce test cost and measurement time.

Corresponding to the situation and requirement, we do offer a new impedance measurement solutions and applications using the LF-RF VNA (E5061B-3L5) with impedance analysis option (Option 005). This webcast focuses on impedance measurements, and presents what's new with and how to use the LF-RF VNA which covers wide frequency and impedance range: 5 Hz to 3 GHz, milliohm to high-impedance. Also, we provide some typical application examples with measurement tips for evaluating passive components used in electronic circuits / equipments, and characterizing power distribution network (PDN) components for power integrity (PI).

Who should view this webcast:
Engineers working on analog circuits and power management circuits of electronic equipment and systems in various industrial fields, including computer, automotive, medical, aerospace & defense, and so on; passive components such as capacitors, inductors / transducers, resonators and/or PDN components such as by-pass capacitors, DC-DC converters, PCBs.

Also, anyone currently using old-style impedance analyzers and/or combination analyzers such as 4192A / 4194A / 4195A / 4395A, and looking for a replacement would find this seminar of great interest.

Giveaway:
Registrants who completely fill out the feedback form by July 19, 2011 will be eligible to win one of two $75 Amazon.com gift certificates. Drawing only open to residents of the 50 United States and Canada (except Quebec). Official rules.

Presenter:
Hiroshi Kanda, Product Manager, Component Test Division, Agilent Technologies
Hiroshi Kanda is a product manager for the Component Test Division of Agilent Technologies in Kobe, Japan. He is responsible for product marketing and application developments for the network analyzers. Most recently he worked for the impedance analysis function for LF-RF network analyzer and its applications.




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