News & Analysis
STARC assesses Mentor's Calibre xACT 3D extraction tool
Anne-Francoise Pele
3/25/2011 10:47 AM EDT
PARIS – Mentor Graphics Corp. announced that the Tokyo-based Semiconductor Technology Academic Research Center (STARC) has disclosed the evaluation results for its Calibre xACT 3D Field Solver extraction tool.
Mentor said its xACT 3D provides a complete parasitic extraction solution with deterministic field solver accuracy, process variation modeling, electrically aware reduction, and industry standard netlist format, all within the design environment. (To access the datasheet, click here).
After an extensive evaluation, STARC indicated that Mentor's Calibre xACT 3D extraction product delivers both reference level accuracy and high performance, enabling very high quality extraction for large IPs.
"Our benchmark included a wide range of evaluation data ranging from small cells and routing patterns up to large blocks," stated Kunihiko Tsuboi, senior manager of Mixed Signal Design Group/Development Department-2 at STARC. "We found that Calibre xACT 3D closely matched our reference values and, at the same time, demonstrated performance and capacity sufficient to handle multi-million transistor SRAMs, not just small cells. We also found xACT 3D to be an excellent tool for analyzing parasitic capacitances associated with transistor-level devices."
Mentor said its xACT 3D provides a complete parasitic extraction solution with deterministic field solver accuracy, process variation modeling, electrically aware reduction, and industry standard netlist format, all within the design environment. (To access the datasheet, click here).
After an extensive evaluation, STARC indicated that Mentor's Calibre xACT 3D extraction product delivers both reference level accuracy and high performance, enabling very high quality extraction for large IPs.
"Our benchmark included a wide range of evaluation data ranging from small cells and routing patterns up to large blocks," stated Kunihiko Tsuboi, senior manager of Mixed Signal Design Group/Development Department-2 at STARC. "We found that Calibre xACT 3D closely matched our reference values and, at the same time, demonstrated performance and capacity sufficient to handle multi-million transistor SRAMs, not just small cells. We also found xACT 3D to be an excellent tool for analyzing parasitic capacitances associated with transistor-level devices."
|
|
|
|
|
Navigate to related information