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| IMEC, Atrenta to show 3-D design flow at DAC | 05/24/2011 |
| STMicroelectronics' design kit has memory BIST/repair | 06/22/2009 |
| Atrenta Announces Design-for-Test Solution | 03/12/2008 |
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Signal integrity issues on the riseOur virtual panel shares eye-opening advice for anticipating, detecting, and mitigating SI problems in faster, increasingly complex designs.








