Trio of free application resources covers broadband distortion measurements, RFID tag testing, and satellite payload assessment

Agilent Technologies has releases two application notes, plus a seminar on CD, covering some key RF and related areas; all are free:

• "Improved Methods for Measuring Distortion in Broadband Devices" illustrates the importance of characterizing broadband commercial and defense systems for linearity. The information focuses on the tests used to determine the level of a system's distortion and how they relate to Intermodulation Distortion (IMD) and Intermodulation Distortion Noise (IMDN). It summarizes with the test methods and the instruments used. This application note can be downloaded at http://cp.literature.agilent.com/litweb/pdf/5989-9880EN.pdf.
• "Non-Contact Measurement Method for 13.56 MHz RFID Tags" was created for engineers who design and test for these increasingly common RFID tags. The document gives an overview of the non-contacting measurement method using network analyzers. To help engineers perform accurate measurements, the application note provides data on measurement errors as well as repeatability data by comparing an alternative method using a spectrum analyzer with a tracking generator function. A customer case is introduced from Sony Corporation's FeliCa™ Evaluation Lab that uses an Agilent ENA-L network analyzer as a standard instrument for testing their FeliCa RFID tags. This application note can be downloaded at http://cp.literature.agilent.com/litweb/pdf/5990-3443EN.pdf.
• "2008 Innovations in Satellite Payload Test Seminar" is an orderable CD that covers the seven presentations from Agilent's recently completed seminar on this topic. The CD provides technical insights and best practices into test technology for satellite payloads. To order, go to https://www.home.agilent.com/agilent/editorial.jspx?cc=US&lc=eng&ckey=1617923&nid=-35198.0.02&id=1617923.

Bill Schweber, Editor, RF DesignLine