Product Brief
Freescale adopts Kinesys test platform for auto ICs
12/3/2009 1:42 PM EST
Freescale Semiconductor and KinesysTest Advantage said they have implemented a technology that eliminates the "wall" separating wafer manufacturing data and die electrical test data.
The partners said the technology targets hybrid automotive quality requirements.
Freescale is using a software platform from Kinesys (Tempe, Ariz.) at its Toulouse, France, facility to improve the reliability of its automotive ICs. The platform provides a multi-process flow data analysis capability for detecting auto device performance shortfalls.
Kinesys claims its "Streetwise" platform can analyze data from as many as 10 wafer manufacturing process flows.
Freescale said the platform allows it to process wafer lots with up to 10 flows of in-process and electrical test die per wafer in a single pass.
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