You don't want to get me started on test patterns. Emerging specs require PRBS31, which is a stupid choice because it's so long that no equipment (not even BERTs) can measure TJ with appreciable statistical significance on that pattern.
Check the DesignCon site for a paper last year by Marty Miller on test pattern lengths.
I wrote one for Tek, but the link seems to have gone away. Send me a note and I'll get it to you: email@example.com
As we unveil EE Times’ 2015 Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. Panelists Dan Armbrust (investment firm Silicon Catalyst), Andrew Kau (venture capital firm Walden International), and Stan Boland (successful serial entrepreneur, former CEO of Neul, Icera) join in the live debate.