I program in C+ .Net, C#.Net, Assembler, and VB6. I currently designing a PCB targeted at automotive M2M.
I am looking at a built-in-self-test for the product. I do not have a any 'battle' experience with FPGAs or ASICs to speak of. Can an FPGA/ASIC be employed as the core of the built-in-self-test test structure.
Any pointers or comments would be most appreciated.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.