If I remember correctly, one of the major issues with the reduced features is the wafer yield due to bad cells in arrays. One way that was used (not sure if everyone does this now) was to provide redundant rows/arrays and at die test blow fuses to switch to good from bad arrays. The thing about DRAM technology was not just that it drove the process but it lead the way to maturing of the process due to the large volumes that DRAMs entailed. I look forward to the next leap in technology (what ever that is).
NASA's Orion Flight Software Production Systems Manager Darrel G. Raines joins Planet Analog Editor Steve Taranovich and Embedded.com Editor Max Maxfield to talk about embedded flight software used in Orion Spacecraft, part of NASA's Mars mission. Live radio show and live chat. Get your questions ready.
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